Document Type

Poster

Publication Date

Summer 2022

Abstract

We have used spectroscopic ellipsometry to map the dielectric function of Poly(disperse Red 1 methacrylate) (PDRM), a thermo-responsive polymer, while it underwent a structural transformation. The polymer films were fabricated by dissolving PDRM in tetrahydrofuran, and spin coating films on silicon substrates. Several spin speeds were attempted in order to produce films with varying thicknesses. After fabricating the films, We used spectroscopic ellipsometry to map the dielectric function of the polymer, while it underwent a structural transformation. The polymer films were fabricated by dissolving PDRM in tetrahydrofuran, and spin coating films on silicon substrates. After fabricating the films, we used UV-VIS spectroscopic ellipsometry to determine the index of refraction, extinction coefficient and the thickness of each film. Using a heating cell coupled to the ellipsometer, we obtained temperature dependent ellipsometry data from 34 °C to 180 °C, spanning a spectral region between 300 nm and 1500 nm. We used the raw data to determine that the glass transition temperature of PDRM was 85 °C ± 3 °C. The temperature dependent dielectric functions of PDRM films were obtained using a three-oscillator model. Subsequently, the films were photoisomerized for two polarizations using a visible laser. For the horizontal polarization, there is nearly a 15% a change in the extinction coefficient during the cis-trans change in PDRM.

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In Copyright - Non-Commercial Use Permitted