Document Type
Poster
Publication Date
Summer 2024
Abstract
Platinum Diselenide is a material that varies its properties depending on thickness; most of the time it functions as a metal, but at a few layers thick, it acts as a semiconductor. Using samples grown at Penn State, we modeled the time-dependent growth and annealment data to model the Dielectric Function of Platinum Diselenide while being co-deposited on a Sapphire substrate using molecular beam epitaxy. Analysis was performed through spectroscopic ellipsometry to obtain the dielectric function. Additionally, X-Ray Reflectivity was used to determine the density and roughness of our Platinum Diselenide samples. Using these methods of analysis, we created a model that represents Platinum Diselenide at various thicknesses, which in turn will allow us to determine the quality of these samples.
Recommended Citation
Peterson, Owen; Saeed, Hatim; and Peiris, Frank, "Exploring the quality of PtSe2 thin films using Spectroscopic Ellipsometry and X-Ray Reflectivity" (2024). Kenyon Summer Science Scholars Program. Paper 697.
https://digital.kenyon.edu/summerscienceprogram/697