Investigating the Electron–Phonon Coupling of Molecular Beam Epitaxy-Grown Hg 1− x Cd x Se Semiconductor Alloys
Using spectroscopic ellipsometry, the temperature-dependence of the dielectric functions of a series of Hg1−xCd x Se thin films deposited on both ZnTe/Si(112) and GaSb(112) substrates were investigated. Initially, for each sample, room-temperature ellipsometric spectra were obtained from 35 meV to 6 eV using two different ellipsometers. Subsequently, ellipsometry spectra were obtained from 10 K to 300 K by incorporating a cryostat to the ellipsometer. Using a standard inversion technique, the spectroscopic ellipsometric data were modeled in order to obtain the temperature-dependent dielectric functions of each of the Hg1−xCd x Se thin films. The results indicate that the E1 critical point blue-shifts as a function of Cd-alloy concentration. The temperature-dependence of E1 was fitted to a Bose–Einstein occupation distribution function, which consequently allowed us to determine the electron–phonon coupling of Hg1−xCd x Se alloys. From the fitting results, we obtain a value of 17 ± 2 meV for the strength of the electron–phonon coupling for Hg1−xCd x Se alloy system, which compares nominally with the binary systems, such as CdSe and CdTe, which have values around 38 meV and 16 meV, respectively. This implies that the addition of Hg into the CdSe binary system does not significantly alter its electron–phonon coupling strength. Raman spectroscopy measurements performed on all the samples show the HgSe-like transverse optic (TO) and longitudinal optic (LO) phonons (∼ 130 cm−1 and ∼ 160 cm−1, respectively) for all the samples. While there is a slight red-shift of the HgSe-like TO peak as a function of the Cd-concentration, HgSe-like LO peak does not significantly change with the alloy concentration.
Peiris, F.; Lewis, M.; Brill, G.; Doyle, Kevin; and Myers, T., "Investigating the Electron–Phonon Coupling of Molecular Beam Epitaxy-Grown Hg 1− x Cd x Se Semiconductor Alloys" (2018). Journal of Electronic Materials. Faculty Publications. Paper 292.
Journal of Electronic Materials