Dependence of indices of refraction on Mn composition of Zn1−xMnxSe thin films using prism coupler technique
We have measured the dependence of the indices of refraction n on alloy composition x of Zn1−xMnxSe films grown by MBE on GaAs (100) substrates for a series of alloy compositions x. The Mn compositions of the films were determined by XRD. A prism coupler technique was used to measure n and thickness of each of the alloy films. On the whole, the indices of refraction nobtained by this method decrease linearly as increasing x showing an inverse relationship with respect to their band gaps, in spite of showing a minimum in the near-band gap energy in the region of 0 ≤ x ≤ 0.1. We obtained a linear calibration function for n as from the prism coupler technique, which can be used to make an accurate estimate the Mn composition in the Zn1−xMnxSe alloy system if you only measure n. And, the crystalline quality of the Zn1−xMnxSe alloy film was deteriorated showing an exponential dependence of FWHM ratio of alloy layer to GaAs substrate obtained from DCRC as increasing Mn mole fraction.
Um, Y. H., Hwang, Y. H., Peiris, F. C. and Furdyna, J. K. (2004), Dependence of indices of refraction on Mn composition of Zn1−xMnxSe thin films using prism coupler technique. phys. stat. sol. (b), 241: 1677–1680. doi:10.1002/pssb.200304640.
physica status solidi (a)